TP65H100G4LSGB Key Features
- Gen IV technology
- JEDEC-qualified GaN technology
- Dynamic RDS(on)eff production tested
- Robust design, defined by
- Wide gate safety margin
- Transient over-voltage capability
- Very low QRR
- Reduced crossover loss
- RoHS pliant and Halogen-free packaging
- Pin-to-pin drop in with e-mode (higher Vt)