HCS00MS Datasheet - Intersil Corporation

HCS00MS Radiation Hardened Quad 2-Input NAND Gate

The Intersil HCS00MS is a Radiation Hardened Quad 2Input NAND Gate. A high on both inputs forces the output to a Low state. The HCS00MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCS00MS.

HCS00MS Features

* 3 Micron Radiation Hardened SOS CMOS

* Total Dose 200K RAD (Si)

* SEP Effective LET No Upsets: >100 MEV-cm2/mg

* Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ)

* Dose Rate Survivability: >1 x 1012 RAD (Si)/s

* Dose Rate Upset >101

HCS00MS_IntersilCorporation.pdf