SCANPSC110F Datasheet (Fairchild Semiconductor) - SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port

SCANPSC110F, SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port

The SCANPSC110F Bridge extends the IEEE Std.

1149.1 test bus into a multidrop test bus environment.

The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules.

SCANPSC110F Features

* s True IEEE1149.1 hierarchical and multidrop addressable capability s The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses s 3 IEEE 1149.1-compatible configurable local scan ports s Mode Register allows local TAPs to be bypassed, selected for ins