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SCANPSC100F Embedded Boundary Scan Controller

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Description

OBSOLETE SCANPSC100F www.ti.com SNOS134D * SEPTEMBER 1998 * REVISED APRIL 2013 SCANPSC100F Embedded Boundary Scan Controller (IEEE.
The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus.

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Features

* 1
* 23 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture

Applications

* of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. FACT is a trademark of Fairchild Semiconductor. 2 All other trademarks are the property of their respective owners. 3 PRODUCTION DATA information is current as of publication date. Products co

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Embedded Boundary Scan Controller Texas Instruments
Texas Instruments SCANPSC100F-like datasheet