* 1
* 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
* Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
* Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Rang
SCANSTA101 Datasheet (918.61 KB)
SCANSTA101
918.61 KB
Low voltage ieee 1149.1 system test access master.
SCANSTA101
www.ti.com
SNLS057J
* MAY 2002
* REVISED APRIL 2013
SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
C.
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