SCANSTA101 Datasheet (Texas Instruments) - Low Voltage IEEE 1149.1 System Test Access Master

SCANSTA101, Low Voltage IEEE 1149.1 System Test Access Master

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.

It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.

SCANSTA101 Features

* 1

* 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture

* Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0

* Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Rang