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SCANSTA101 Low Voltage IEEE 1149.1 System Test Access Master

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Description

SCANSTA101 www.ti.com SNLS057J * MAY 2002 * REVISED APRIL 2013 SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master C.
The SCANSTA101 is designed to function as a test master for an IEEE 1149.

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Features

* 1
* 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture

Applications

* and as a component in a standalone boundary scan tester. The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices. The SCANST

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SCANSTA101 Low Voltage IEEE 1149.1 System Test Access Master Texas Instruments
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