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SCANSTA101 Datasheet - Texas Instruments

SCANSTA101 Low Voltage IEEE 1149.1 System Test Access Master

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester. The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. .

SCANSTA101 Features

* 1

* 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture

* Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0

* Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Rang

SCANSTA101 Datasheet (918.61 KB)

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Datasheet Details

Part number:

SCANSTA101

Manufacturer:

Texas Instruments ↗

File Size:

918.61 KB

Description:

Low voltage ieee 1149.1 system test access master.

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SCANSTA101 Low Voltage IEEE 1149.1 System Test Access Master Texas Instruments

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