Part number:
SCANSTA101
Manufacturer:
File Size:
918.61 KB
Description:
Low voltage ieee 1149.1 system test access master.
Datasheet Details
Part number:
SCANSTA101
Manufacturer:
File Size:
918.61 KB
Description:
Low voltage ieee 1149.1 system test access master.
SCANSTA101, Low Voltage IEEE 1149.1 System Test Access Master
The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system.
It is suitable for use in embedded IEEE 1149.1 applications and as a component in a standalone boundary scan tester.
The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100.
SCANSTA101 Features
* 1
* 2 Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
* Supported by Texas Instruments' SCAN Ease (SCAN Embedded Application Software Enabler) Software Rev 2.0
* Uses Generic, Asynchronous Processor Interface; Compatible with a Wide Rang
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