2N7002KU Description
SEMICONDUCTOR TECHNICAL DATA INTERFACE AND SWITCHING APPLICATION.
2N7002KU Key Features
- Gate-Body Leakage, Reverse
- Gate Threshold Voltage Drain-Source ON Resistance Forward Transconductance
- Input Capacitance Reverse Transfer Capacitance
- Output Capacitance
- Switching Time
- VDD=30V, ID=300mA, VGS=10V (Note 3) toff
- Note 3) Pulse Test : Pulse Width 80 , Duty Cycle 1%
- 2.0 1.2 1.5 1.45 1.9 -0.9 1.2
- SWITCHING TIME TEST CIRCUIT
- 50 0 50 100 JUNCTION TEMPERATURE Tj ( C)